All Events

FrED factory robotics demo—Aug. 1

The MIT FrED Factory who will be demoing their Fiber Extrusion Device at the Venture Café Connection Collider on July 25 and August 1 from 5pm - 7:30pm.

FrED Factory is a MIT lab building Fiber Extrusion devices for educational purposes. The aim of their demo is to get feedback on the device whose first 50 units will be sold this August to professionals looking to train their team on the implication of changing parameters on a closed loop control system.

During the demo, you will be able to modify temperature and motor speed to see the consequences on the diameter of a fiber in real time.

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The 2024 Nano Summit—Oct. 23

The Nano Summit serves as the flagship conference for MIT.nano, showcasing groundbreaking advancements in nanoscience and nanotechnology. This year's summit will delve into the transformative impact of nanoscience as it relates to microscopy, materials science, AI and machine learning, hard technology, human health, and more.

Characterization User Forum - June 5

Join us for the Characterization User Forum featuring X-Ray Diffraction facility capabilities:

  • Get to know your Characterization community.
  • Learn how to avoid pitfalls in phase ID.
  • Bring questions about your data.
  • Share your feedback in the user-led town hall.
  • Stay up to date with facility news.

Tool Talk with In-Situ Microscopy Solutions—Apr. 25

Join MIT.nano for a tool talk with In-Situ Microscopy Solutions

12-0168 (MIT.nano basement)

Workshop Schedule:

09:00 - 09.45  Registration and Coffee
09:45 - 10:00 Introduction of the In-situ Microscopy Alliance (IMA)
10:00 - 10:30 Recent innovation in small-scale in-situ mechanical properties testing, Dr. Nicholas Randall, Alemnis
10:30 - 11:00 Mechanics of architected materials through the lens of in situ characterization, Prof. Carlos Portela, MIT
11:00 - 11:15 Break and networking
11:15 - 11:45 Latest updates in electro-optical characterizations and failure analysis, Mr. Karl Boche, Imina Technologies
11:45 - 12:15 Metal layers short localization with EBAC and FIB circuit modifications, Mr. Karl Boche
12:15 - 13:30 Lunch (Provided by In Situ Microscopy Alliance)
13:30 - 14:00  AFM-in-SEM - step forward for in-situ correlative microscopy, technology and applications, Dr. Jan Neuman, Nenovision
14:00 - 14:30 Benefits of AFM-in-SEM for applications in material science and battery research, Dr. Jan Neuman, NenoVision
14.30 – 15.00  Guided tour around MIT.nano, Dr. Anna Osherov
15:00 – 16.00  Open discussion

 

Read more and register